Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/39993
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dc.coverage.spatialen_US
dc.date.accessioned2015-05-01T11:24:21Z-
dc.date.available2015-05-01T11:24:21Z-
dc.date.issued2015-05-01-
dc.identifier.urihttp://hdl.handle.net/10603/39993-
dc.description.abstractnewlineen_US
dc.format.extenten_US
dc.languageEnglishen_US
dc.relationen_US
dc.rightsuniversityen_US
dc.titleFAULT DIAGNOSTIC TECHNIQUES FOR VLSIen_US
dc.title.alternativeen_US
dc.creator.researcherDivya Sharmaen_US
dc.subject.keywordVHDL (Very high speed integrated circuits Hardware Description Language), Automatic Test Equipmenten_US
dc.description.noteattacheden_US
dc.contributor.guideAgarwal, P, Rajendra.en_US
dc.publisher.placeMeeruten_US
dc.publisher.universityShobhit Universityen_US
dc.publisher.institutionFaculty of Engineering and Technologyen_US
dc.date.registered31/12/2010en_US
dc.date.completed27/04/2013en_US
dc.date.awarded09/09/2013en_US
dc.format.dimensionsen_US
dc.format.accompanyingmaterialNoneen_US
dc.source.universityUniversityen_US
dc.type.degreePh.D.en_US
Appears in Departments:Faculty of Engineering and Technology

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