Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/39993
Title: FAULT DIAGNOSTIC TECHNIQUES FOR VLSI
Researcher: Divya Sharma
Guide(s): Agarwal, P, Rajendra.
Keywords: VHDL (Very high speed integrated circuits Hardware Description Language), Automatic Test Equipment
Upload Date: 1-May-2015
University: Shobhit University
Completed Date: 27/04/2013
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/39993
Appears in Departments:Faculty of Engineering and Technology

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