Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/125050
Title: Spectroscopic studies of semiconductor materials
Researcher: Jothilakshmi, R
Guide(s): Ramakrishnan, V
Keywords: Optoelectronics
Semiconductors
Transistor
X-rays
University: Madurai Kamraj University
Completed Date: 2009
Abstract: None
Pagination: 163p.
URI: http://hdl.handle.net/10603/125050
Appears in Departments:Department of Physics

Files in This Item:
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01_title.pdfAttached File113.25 kBAdobe PDFView/Open
02_declaration.pdf86.67 kBAdobe PDFView/Open
03_certificate.pdf162.69 kBAdobe PDFView/Open
04_acknowledgement.pdf89.09 kBAdobe PDFView/Open
05_content.pdf76.39 kBAdobe PDFView/Open
06_abbreviation.pdf85.62 kBAdobe PDFView/Open
07_figure.pdf86.84 kBAdobe PDFView/Open
08_table.pdf72.88 kBAdobe PDFView/Open
09_preface.pdf187.62 kBAdobe PDFView/Open
10_chapter 1.pdf627.01 kBAdobe PDFView/Open
11_chapter 2.pdf1.58 MBAdobe PDFView/Open
12_chapter 3.pdf1.78 MBAdobe PDFView/Open
13_chapter 4.pdf384.42 kBAdobe PDFView/Open
14_chapter 5.pdf428.8 kBAdobe PDFView/Open
15_chapter 6.pdf276.58 kBAdobe PDFView/Open


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