Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/116949
Title: Reliability analysis of some semi conductor based systems
Researcher: Kumar, Manoj
Guide(s): Mittal, C L
Keywords: Probabilistic
Programmable
Reliability
Remedies
Systems
University: Maharshi Dayanand University
Completed Date: 27/09/2004
Abstract: Abstract not available
Pagination: x, 188p.
URI: http://hdl.handle.net/10603/116949
Appears in Departments:Department of Electronics

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01_title page.pdfAttached File24.47 kBAdobe PDFView/Open
02_certificate.pdf53.48 kBAdobe PDFView/Open
03_acknowledgement.pdf42.86 kBAdobe PDFView/Open
04_publication.pdf23.98 kBAdobe PDFView/Open
05_content.pdf82.51 kBAdobe PDFView/Open
06_notation.pdf34.45 kBAdobe PDFView/Open
07_chapter 1.pdf1.07 MBAdobe PDFView/Open
08_chapter 2.pdf552.14 kBAdobe PDFView/Open
09_chapter 3.pdf530.79 kBAdobe PDFView/Open
10_chapter 4.pdf613.12 kBAdobe PDFView/Open
11_chapter 5.pdf593.99 kBAdobe PDFView/Open
12_chapter 6.pdf625.5 kBAdobe PDFView/Open
13_chapter 7.pdf800.97 kBAdobe PDFView/Open
14_bibliography.pdf505.53 kBAdobe PDFView/Open


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